Do you have a challenging materials characterization project? We have extensive experience in a wide variety of measurement techniques including X-ray Scattering, X-ray Absorption Spectroscopy (XAS), Total-Reflection X-ray Fluorescence (TXRF), and X-ray microscopy. We are also experienced in Inductively-Coupled-Plasma Mass Spectroscopy (ICP-MS), etc.
The Principals of the company are both Stanford-trained Ph.D.s in Materials Science with many years of experience both at the synchrotron and in industry. We look forward to meeting with you and discussing your project.